Yutaka Tamiya, Yoshinori Tomita, Toshiyuki Ichiba, Kaoru Kawamura. Sequence-based In-Circuit Breakpoints for Post-Silicon Debug (Abstract Only). In George A. Constantinides, Deming Chen, editors, Proceedings of the 2015 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays, Monterey, CA, USA, February 22-24, 2015. pages 263, ACM, 2015. [doi]
@inproceedings{TamiyaTIK15,
title = {Sequence-based In-Circuit Breakpoints for Post-Silicon Debug (Abstract Only)},
author = {Yutaka Tamiya and Yoshinori Tomita and Toshiyuki Ichiba and Kaoru Kawamura},
year = {2015},
doi = {10.1145/2684746.2689102},
url = {http://doi.acm.org/10.1145/2684746.2689102},
researchr = {https://researchr.org/publication/TamiyaTIK15},
cites = {0},
citedby = {0},
pages = {263},
booktitle = {Proceedings of the 2015 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays, Monterey, CA, USA, February 22-24, 2015},
editor = {George A. Constantinides and Deming Chen},
publisher = {ACM},
isbn = {978-1-4503-3315-3},
}