C. W. Tan, Y. C. Chan, N. H. Yeung. Effect of autoclave test on anisotropic conductive joints. Microelectronics Reliability, 43(2):279-285, 2003. [doi]
@article{TanCY03,
title = {Effect of autoclave test on anisotropic conductive joints},
author = {C. W. Tan and Y. C. Chan and N. H. Yeung},
year = {2003},
doi = {10.1016/S0026-2714(02)00293-7},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00293-7},
tags = {testing, C++},
researchr = {https://researchr.org/publication/TanCY03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {2},
pages = {279-285},
}