Wen Tan, Caifen Fu. Linear Active Disturbance-Rejection Control: Analysis and Tuning via IMC. IEEE Transactions on Industrial Electronics, 63(4):2350-2359, 2016. [doi]
@article{TanF16,
title = {Linear Active Disturbance-Rejection Control: Analysis and Tuning via IMC},
author = {Wen Tan and Caifen Fu},
year = {2016},
doi = {10.1109/TIE.2015.2505668},
url = {http://dx.doi.org/10.1109/TIE.2015.2505668},
researchr = {https://researchr.org/publication/TanF16},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {63},
number = {4},
pages = {2350-2359},
}