Systematic Analysis of Circular Artifacts for Stylegan - researchr publication authors

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Way Tan, Bihan Wen, Cen Chen, Zeng Zeng, XuLei Yang. Systematic Analysis of Circular Artifacts for Stylegan. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 3902-3906, IEEE, 2021. [doi]

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