Improved transformed deviance statistic for testing a logistic regression model

Nobuhiro Taneichi, Yuri Sekiya, Jun Toyama. Improved transformed deviance statistic for testing a logistic regression model. J. Multivariate Analysis, 102(9):1263-1279, 2011. [doi]

Authors

Nobuhiro Taneichi

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Yuri Sekiya

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Jun Toyama

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