Tong Boon Tang, Alan F. Murray, Scott Roy. Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models. IEEE Trans. on Circuits and Systems, 57-I(5):1062-1070, 2010. [doi]
@article{TangMR10,
title = {Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models},
author = {Tong Boon Tang and Alan F. Murray and Scott Roy},
year = {2010},
doi = {10.1109/TCSI.2010.2043988},
url = {http://dx.doi.org/10.1109/TCSI.2010.2043988},
researchr = {https://researchr.org/publication/TangMR10},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {57-I},
number = {5},
pages = {1062-1070},
}