Affordable High Throughput Field Detection of Wheat Stripe Rust Using Deep Learning with Semi-Automated Image Labeling

Zhou Tang, Meinan Wang, Michael Schirrmann, Karl-Heinz Dammer, Xianran Li, Robert Brueggeman, Sindhuja Sankaran, Arron H. Carter, Michael O. Pumphrey, Yang Hu, Xianming Chen, Zhiwu Zhang. Affordable High Throughput Field Detection of Wheat Stripe Rust Using Deep Learning with Semi-Automated Image Labeling. Computers and Electronics in Agriculture, 207:107709, April 2023. [doi]

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