Cen Tang, Gang Xie, Kuang Sheng. Study of the leakage current suppression for hybrid-Schottky/ohmic drain AlGaN/GaN HEMT. Microelectronics Reliability, 55(2):347-351, 2015. [doi]
@article{TangXS15,
title = {Study of the leakage current suppression for hybrid-Schottky/ohmic drain AlGaN/GaN HEMT},
author = {Cen Tang and Gang Xie and Kuang Sheng},
year = {2015},
doi = {10.1016/j.microrel.2014.10.018},
url = {http://dx.doi.org/10.1016/j.microrel.2014.10.018},
researchr = {https://researchr.org/publication/TangXS15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {2},
pages = {347-351},
}