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Risk Assessment of Home Gateway/Smart Meter in Smart Grid Service

Shigeaki Tanimoto, Rei Kinno, Motoi Iwashita, Tohru Kobayashi, Hiroyuki Sato, Atsushi Kanai. Risk Assessment of Home Gateway/Smart Meter in Smart Grid Service. In 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016, Kumamoto, Japan, July 10-14, 2016. pages 1126-1131, IEEE, 2016. [doi]

Authors

Shigeaki Tanimoto

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Rei Kinno

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Motoi Iwashita

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Tohru Kobayashi

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Hiroyuki Sato

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Atsushi Kanai

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