Risk assessment of BYOD: Bring your own device - researchr publication authors

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Shigeaki Tanimoto, Susumu Yamada, Motoi Iwashita, Toru Kobayashi, Hiroyuki Sato, Atsushi Kanai. Risk assessment of BYOD: Bring your own device. In IEEE 5th Global Conference on Consumer Electronics, GCCE 2016, Kyoto, Japan, October 11-14, 2016. pages 1-4, IEEE, 2016. [doi]

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