Sarmad Tanwir, Michael S. Hsiao, Loganathan Lingappan. Hardware-in-the-loop model-less diagnostic test generation. In IEEE International High Level Design Validation and Test Workshop, HLDVT 2016, Santa Cruz, CA, USA, October 7-8, 2016. pages 128-135, IEEE, 2016. [doi]
@inproceedings{TanwirHL16,
title = {Hardware-in-the-loop model-less diagnostic test generation},
author = {Sarmad Tanwir and Michael S. Hsiao and Loganathan Lingappan},
year = {2016},
doi = {10.1109/HLDVT.2016.7748266},
url = {http://doi.ieeecomputersociety.org/10.1109/HLDVT.2016.7748266},
researchr = {https://researchr.org/publication/TanwirHL16},
cites = {0},
citedby = {0},
pages = {128-135},
booktitle = {IEEE International High Level Design Validation and Test Workshop, HLDVT 2016, Santa Cruz, CA, USA, October 7-8, 2016},
publisher = {IEEE},
isbn = {978-1-5090-4270-8},
}