A process- and temperature-tolerant power-on reset circuit with a flexible detection level higher than the bandgap voltage

Toru Tanzawa. A process- and temperature-tolerant power-on reset circuit with a flexible detection level higher than the bandgap voltage. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 2302-2305, IEEE, 2008. [doi]

@inproceedings{Tanzawa08,
  title = {A process- and temperature-tolerant power-on reset circuit with a flexible detection level higher than the bandgap voltage},
  author = {Toru Tanzawa},
  year = {2008},
  doi = {10.1109/ISCAS.2008.4541914},
  url = {http://dx.doi.org/10.1109/ISCAS.2008.4541914},
  researchr = {https://researchr.org/publication/Tanzawa08},
  cites = {0},
  citedby = {0},
  pages = {2302-2305},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA},
  publisher = {IEEE},
}