Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis

Veeresh Taranalli, Hironori Uchikawa, Paul H. Siegel. Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis. IEEE Transactions on Communications, 64(8):3169-3181, 2016. [doi]

Authors

Veeresh Taranalli

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Hironori Uchikawa

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Paul H. Siegel

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