Augusto Tazzoli, L. Cerati, A. Andreini, Gaudenzio Meneghesso. Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology. Microelectronics Reliability, 49(9-11):1111-1115, 2009. [doi]
@article{TazzoliCAM09,
title = {Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology},
author = {Augusto Tazzoli and L. Cerati and A. Andreini and Gaudenzio Meneghesso},
year = {2009},
doi = {10.1016/j.microrel.2009.07.020},
url = {http://dx.doi.org/10.1016/j.microrel.2009.07.020},
researchr = {https://researchr.org/publication/TazzoliCAM09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1111-1115},
}