Fatemeh Tehranipoor, Wei Yan, John A. Chandy. Robust hardware true random number generators using DRAM remanence effects. In William H. Robinson, Swarup Bhunia, Ryan Kastner, editors, 2016 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2016, McLean, VA, USA, May 3-5, 2016. pages 79-84, IEEE Computer Society, 2016. [doi]
@inproceedings{TehranipoorYC16,
title = {Robust hardware true random number generators using DRAM remanence effects},
author = {Fatemeh Tehranipoor and Wei Yan and John A. Chandy},
year = {2016},
doi = {10.1109/HST.2016.7495561},
url = {http://doi.ieeecomputersociety.org/10.1109/HST.2016.7495561},
researchr = {https://researchr.org/publication/TehranipoorYC16},
cites = {0},
citedby = {0},
pages = {79-84},
booktitle = {2016 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2016, McLean, VA, USA, May 3-5, 2016},
editor = {William H. Robinson and Swarup Bhunia and Ryan Kastner},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-8826-9},
}