Ramesh C. Tekumalla, Prakash Krishnamoorthy. Local Repair Signature Handling for Repairable Memories. In IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014. pages 1-5, IEEE, 2014. [doi]
@inproceedings{TekumallaK14, title = {Local Repair Signature Handling for Repairable Memories}, author = {Ramesh C. Tekumalla and Prakash Krishnamoorthy}, year = {2014}, doi = {10.1109/NATW.2014.10}, url = {http://dx.doi.org/10.1109/NATW.2014.10}, researchr = {https://researchr.org/publication/TekumallaK14}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014}, publisher = {IEEE}, }