Bisous model - Detecting filamentary patterns in point processes

Elmo Tempel, Radu S. Stoica, Rain Kipper, Enn Saar. Bisous model - Detecting filamentary patterns in point processes. Astron. Comput., 16:17-25, 2016. [doi]

Authors

Elmo Tempel

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Radu S. Stoica

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Rain Kipper

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Enn Saar

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