Vasileios Tenentes, Xrysovalantis Kavousianos. Self-Freeze Linear Decompressors: Test Pattern Generators for Low Power Scan Testing. In Nikolaos S. Voros, Amar Mukherjee, Nicolas Sklavos, Konstantinos Masselos, Michael Hübner, editors, VLSI 2010 Annual Symposium - Selected papers. Volume 105 of Lecture Notes in Electrical Engineering, pages 217-230, Springer, 2010. [doi]
@inproceedings{TenentesK10a,
title = {Self-Freeze Linear Decompressors: Test Pattern Generators for Low Power Scan Testing},
author = {Vasileios Tenentes and Xrysovalantis Kavousianos},
year = {2010},
doi = {10.1007/978-94-007-1488-5_13},
url = {http://dx.doi.org/10.1007/978-94-007-1488-5_13},
researchr = {https://researchr.org/publication/TenentesK10a},
cites = {0},
citedby = {0},
pages = {217-230},
booktitle = {VLSI 2010 Annual Symposium - Selected papers},
editor = {Nikolaos S. Voros and Amar Mukherjee and Nicolas Sklavos and Konstantinos Masselos and Michael Hübner},
volume = {105},
series = {Lecture Notes in Electrical Engineering},
publisher = {Springer},
isbn = {978-94-007-1487-8},
}