Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang. Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. In DAC. pages 752-757, 1996. [doi]
@inproceedings{TengCRK96,
title = {Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects},
author = {Chin-Chi Teng and Yi-Kan Cheng and Elyse Rosenbaum and Sung-Mo Kang},
year = {1996},
doi = {10.1145/240518.240661},
url = {http://doi.acm.org/10.1145/240518.240661},
tags = {reliability},
researchr = {https://researchr.org/publication/TengCRK96},
cites = {0},
citedby = {0},
pages = {752-757},
booktitle = {DAC},
}