Mariano Tepper, Francisco Gómez, Pablo Musé, Andrés Almansa, Marta Mejail. Morphological Shape Context: Semi-locality and Robust Matching in Shape Recognition. In Eduardo Bayro-Corrochano, Jan-Olof Eklundh, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications, 14th Iberoamerican Conference on Pattern Recognition, CIARP 2009, Guadalajara, Jalisco, Mexico, November 15-18, 2009. Proceedings. Volume 5856 of Lecture Notes in Computer Science, pages 129-136, Springer, 2009. [doi]
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