Accurate negative bias temperature instability lifetime prediction based on hole injection

Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi. Accurate negative bias temperature instability lifetime prediction based on hole injection. Microelectronics Reliability, 48(10):1649-1654, 2008. [doi]

Authors

Akinobu Teramoto

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Rihito Kuroda

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Shigetoshi Sugawa

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Tadahiro Ohmi

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