Pannavat Terdchanakul, Hideaki Hata, Passakorn Phannachitta, Kenichi Matsumoto. Bug or Not? Bug Report Classification Using N-Gram IDF. In 2017 IEEE International Conference on Software Maintenance and Evolution, ICSME 2017, Shanghai, China, September 17-22, 2017. pages 534-538, IEEE Computer Society, 2017. [doi]
@inproceedings{TerdchanakulHPM17,
title = {Bug or Not? Bug Report Classification Using N-Gram IDF},
author = {Pannavat Terdchanakul and Hideaki Hata and Passakorn Phannachitta and Kenichi Matsumoto},
year = {2017},
doi = {10.1109/ICSME.2017.14},
url = {http://doi.ieeecomputersociety.org/10.1109/ICSME.2017.14},
researchr = {https://researchr.org/publication/TerdchanakulHPM17},
cites = {0},
citedby = {0},
pages = {534-538},
booktitle = {2017 IEEE International Conference on Software Maintenance and Evolution, ICSME 2017, Shanghai, China, September 17-22, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-0992-7},
}