Statistical analysis of noise in broadband and high resolution ADCs

Gael Kamdem De Teyou, Hervé Petit, Patrick Loumeau, Hussein Fakhoury, Yann Le Guillou, Stéphane Paquelet. Statistical analysis of noise in broadband and high resolution ADCs. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 490-493, IEEE, 2014. [doi]

Authors

Gael Kamdem De Teyou

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Hervé Petit

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Patrick Loumeau

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Hussein Fakhoury

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Yann Le Guillou

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Stéphane Paquelet

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