Adithya Thaduri, Ajit Kumar Verma, V. Gopika, Rajesh Gopinath, Uday Kumar. Reliability prediction of semiconductor devices using modified physics of failure approach. Int. J. Systems Assurance Engineering and Management, 4(1):33-47, 2013. [doi]
@article{ThaduriVGGK13,
title = {Reliability prediction of semiconductor devices using modified physics of failure approach},
author = {Adithya Thaduri and Ajit Kumar Verma and V. Gopika and Rajesh Gopinath and Uday Kumar},
year = {2013},
doi = {10.1007/s13198-013-0146-9},
url = {http://dx.doi.org/10.1007/s13198-013-0146-9},
researchr = {https://researchr.org/publication/ThaduriVGGK13},
cites = {0},
citedby = {0},
journal = {Int. J. Systems Assurance Engineering and Management},
volume = {4},
number = {1},
pages = {33-47},
}