Feature Maps: A Comprehensible Software Representation for Design Pattern Detection

Hannes Thaller, Lukas Linsbauer, Alexander Egyed. Feature Maps: A Comprehensible Software Representation for Design Pattern Detection. In Xinyu Wang, David Lo 0001, Emad Shihab, editors, 26th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2019, Hangzhou, China, February 24-27, 2019. pages 207-217, IEEE, 2019. [doi]

@inproceedings{ThallerLE19,
  title = {Feature Maps: A Comprehensible Software Representation for Design Pattern Detection},
  author = {Hannes Thaller and Lukas Linsbauer and Alexander Egyed},
  year = {2019},
  doi = {10.1109/SANER.2019.8667978},
  url = {https://doi.org/10.1109/SANER.2019.8667978},
  researchr = {https://researchr.org/publication/ThallerLE19},
  cites = {0},
  citedby = {0},
  pages = {207-217},
  booktitle = {26th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2019, Hangzhou, China, February 24-27, 2019},
  editor = {Xinyu Wang and David Lo 0001 and Emad Shihab},
  publisher = {IEEE},
  isbn = {978-1-7281-0591-8},
}