T. A. Thayer. Understanding software through empirical reliability analysis. In American Federation of Information Processing Societies: 1975 National Computer Conference, 19-22 May 1975, Anaheim, CA, USA. Volume 44 of AFIPS Conference Proceedings, pages 335-341, AFIPS Press, 1975. [doi]
@inproceedings{Thayer75,
title = {Understanding software through empirical reliability analysis},
author = {T. A. Thayer},
year = {1975},
doi = {10.1145/1499949.1500014},
url = {http://doi.acm.org/10.1145/1499949.1500014},
tags = {empirical, analysis, reliability},
researchr = {https://researchr.org/publication/Thayer75},
cites = {0},
citedby = {0},
pages = {335-341},
booktitle = {American Federation of Information Processing Societies: 1975 National Computer Conference, 19-22 May 1975, Anaheim, CA, USA},
volume = {44},
series = {AFIPS Conference Proceedings},
publisher = {AFIPS Press},
}