Decay Replay Mining to Predict Next Process Events

Julian Theis, Houshang Darabi. Decay Replay Mining to Predict Next Process Events. IEEE Access, 7:119787-119803, 2019. [doi]

@article{TheisD19-0,
  title = {Decay Replay Mining to Predict Next Process Events},
  author = {Julian Theis and Houshang Darabi},
  year = {2019},
  doi = {10.1109/ACCESS.2019.2937085},
  url = {https://doi.org/10.1109/ACCESS.2019.2937085},
  researchr = {https://researchr.org/publication/TheisD19-0},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {7},
  pages = {119787-119803},
}