F. Thomas-Brans, Thibaut Heckmann, Konstantinos Markantonakis, Damien Sauveron. New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards. IEEE Access, 10:33742-33757, 2022. [doi]
@article{Thomas-BransHMS22,
title = {New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards},
author = {F. Thomas-Brans and Thibaut Heckmann and Konstantinos Markantonakis and Damien Sauveron},
year = {2022},
doi = {10.1109/ACCESS.2022.3158958},
url = {https://doi.org/10.1109/ACCESS.2022.3158958},
researchr = {https://researchr.org/publication/Thomas-BransHMS22},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {10},
pages = {33742-33757},
}