High Quality Uniform Random Number Generation Using LUT Optimised State-transition Matrices

David B. Thomas, Wayne Luk. High Quality Uniform Random Number Generation Using LUT Optimised State-transition Matrices. VLSI Signal Processing, 47(1):77-92, 2007. [doi]

@article{ThomasL07,
  title = {High Quality Uniform Random Number Generation Using LUT Optimised State-transition Matrices},
  author = {David B. Thomas and Wayne Luk},
  year = {2007},
  doi = {10.1007/s11265-006-0014-9},
  url = {http://dx.doi.org/10.1007/s11265-006-0014-9},
  researchr = {https://researchr.org/publication/ThomasL07},
  cites = {0},
  citedby = {0},
  journal = {VLSI Signal Processing},
  volume = {47},
  number = {1},
  pages = {77-92},
}