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The Impact of Classifier Configuration and Classifier Combination on Bug Localization

Stephen W. Thomas, Meiyappan Nagappan, Dorothea Blostein, Ahmed E. Hassan. The Impact of Classifier Configuration and Classifier Combination on Bug Localization. IEEE Trans. Software Eng., 39(10):1427-1443, 2013. [doi]

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Stephen W. Thomas

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Meiyappan Nagappan

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Dorothea Blostein

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Ahmed E. Hassan

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