Neural Network Inverse Model for Quality Monitoring - Application to a High Quality Lackering Process - researchr publication authors

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Philippe Thomas, Marie-Christine Suhner, Emmanuel Zimmermann, Hind Bril El Haouzi, André Thomas, Mélanie Noyel. Neural Network Inverse Model for Quality Monitoring - Application to a High Quality Lackering Process. In Christophe Sabourin, Juan Julián Merelo Guervós, Una-May O'Reilly, Kurosh Madani, Kevin Warwick, editors, Proceedings of the 9th International Joint Conference on Computational Intelligence, IJCCI 2017, Funchal, Madeira, Portugal, November 1-3, 2017. pages 186-191, SciTePress, 2017. [doi]

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