To what extent could we detect field defects? an empirical study of false negatives in static bug finding tools

Ferdian Thung, Lucia, David Lo, Lingxiao Jiang, Foyzur Rahman, Premkumar T. Devanbu. To what extent could we detect field defects? an empirical study of false negatives in static bug finding tools. In Michael Goedicke, Tim Menzies, Motoshi Saeki, editors, IEEE/ACM International Conference on Automated Software Engineering, ASE'12, Essen, Germany, September 3-7, 2012. pages 50-59, ACM, 2012. [doi]

@inproceedings{ThungLLJRD12,
  title = {To what extent could we detect field defects? an empirical study of false negatives in static bug finding tools},
  author = {Ferdian Thung and Lucia and David Lo and Lingxiao Jiang and Foyzur Rahman and Premkumar T. Devanbu},
  year = {2012},
  doi = {10.1145/2351676.2351685},
  url = {http://doi.acm.org/10.1145/2351676.2351685},
  researchr = {https://researchr.org/publication/ThungLLJRD12},
  cites = {0},
  citedby = {0},
  pages = {50-59},
  booktitle = {IEEE/ACM International Conference on Automated Software Engineering, ASE'12, Essen, Germany, September 3-7, 2012},
  editor = {Michael Goedicke and Tim Menzies and Motoshi Saeki},
  publisher = {ACM},
  isbn = {978-1-4503-1204-2},
}