Single-event-transient effects in silicon-on-insulator ferroelectric double-gate vertical tunneling field effect transistors

Guoliang Tian, Jinshun Bi, Gaobo Xu, Kai Xi, Xueqin Yang, Sandip Majumdar, Huaxiang Yin, Qiuxia Xu, Wenwu Wang. Single-event-transient effects in silicon-on-insulator ferroelectric double-gate vertical tunneling field effect transistors. Science in China Series F: Information Sciences, 63(12), 2020. [doi]

Authors

Guoliang Tian

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Jinshun Bi

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Gaobo Xu

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Kai Xi

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Xueqin Yang

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Sandip Majumdar

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Huaxiang Yin

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Qiuxia Xu

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Wenwu Wang

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