Junfeng Tian, Yongqing Tian. A Model Based on Program Slice and Deep Learning for Software Defect Prediction. In 29th International Conference on Computer Communications and Networks, ICCCN 2020, Honolulu, HI, USA, August 3-6, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{TianT20,
title = {A Model Based on Program Slice and Deep Learning for Software Defect Prediction},
author = {Junfeng Tian and Yongqing Tian},
year = {2020},
doi = {10.1109/ICCCN49398.2020.9209658},
url = {https://doi.org/10.1109/ICCCN49398.2020.9209658},
researchr = {https://researchr.org/publication/TianT20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {29th International Conference on Computer Communications and Networks, ICCCN 2020, Honolulu, HI, USA, August 3-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-6607-0},
}