Hongzhen Tian, Andi Wang, Jialei Chen, Xuzhou Jiang, Jianjun Shi, Chuck Zhang, Yajun Mei, Ben Wang. Treatment Effect Modeling for FTIR Signals Subject to Multiple Sources of Uncertainties. IEEE T. Automation Science and Engineering, 19(2):895-906, 2022. [doi]
@article{TianWCJSZMW22,
title = {Treatment Effect Modeling for FTIR Signals Subject to Multiple Sources of Uncertainties},
author = {Hongzhen Tian and Andi Wang and Jialei Chen and Xuzhou Jiang and Jianjun Shi and Chuck Zhang and Yajun Mei and Ben Wang},
year = {2022},
doi = {10.1109/TASE.2021.3058564},
url = {https://doi.org/10.1109/TASE.2021.3058564},
researchr = {https://researchr.org/publication/TianWCJSZMW22},
cites = {0},
citedby = {0},
journal = {IEEE T. Automation Science and Engineering},
volume = {19},
number = {2},
pages = {895-906},
}