A Novel Fuzzy Echo State Broad Learning System for Surface Roughness Virtual Metrology

Wenwen Tian, Jiong Zhang, Fei Zhao, Gedong Jiang, Xuesong Mei, Guangde Chen, Hao Wang 0048. A Novel Fuzzy Echo State Broad Learning System for Surface Roughness Virtual Metrology. IEEE Trans. Industrial Informatics, 20(3):3756-3766, March 2024. [doi]

@article{TianZZJMCW24,
  title = {A Novel Fuzzy Echo State Broad Learning System for Surface Roughness Virtual Metrology},
  author = {Wenwen Tian and Jiong Zhang and Fei Zhao and Gedong Jiang and Xuesong Mei and Guangde Chen and Hao Wang 0048},
  year = {2024},
  month = {March},
  doi = {10.1109/TII.2023.3310747},
  url = {https://doi.org/10.1109/TII.2023.3310747},
  researchr = {https://researchr.org/publication/TianZZJMCW24},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Industrial Informatics},
  volume = {20},
  number = {3},
  pages = {3756-3766},
}