L. Tielemans, R. Rongen, Ward De Ceuninck. How reliable are reliability tests?. Microelectronics Reliability, 42(9-11):1339-1345, 2002. [doi]
@article{TielemansRC02,
title = {How reliable are reliability tests?},
author = {L. Tielemans and R. Rongen and Ward De Ceuninck},
year = {2002},
doi = {10.1016/S0026-2714(02)00146-4},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00146-4},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/TielemansRC02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
pages = {1339-1345},
}