Yield optimization using advanced statistical correlation methods

Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir. Yield optimization using advanced statistical correlation methods. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-10, IEEE, 2014. [doi]

Authors

Jeff Tikkanen

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Sebastian Siatkowski

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Nik Sumikawa

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Li-C. Wang

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Magdy S. Abadir

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