RICK: Generating Mocks from Production Data

Deepika Tiwari, Martin Monperrus, Benoit Baudry. RICK: Generating Mocks from Production Data. In IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023. pages 464-466, IEEE, 2023. [doi]

Authors

Deepika Tiwari

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Martin Monperrus

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Benoit Baudry

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