Kenneth W. Tobin, Thomas P. Karnowski, Lloyd F. Arrowood, Regina K. Ferrell, James S. Goddard, Fred Lakhani. Content-Based Image Retrieval for Semiconductor Process Characterization. EURASIP J. Adv. Sig. Proc., 2002(7):704-713, 2002. [doi]
@article{TobinKAFGL02,
title = {Content-Based Image Retrieval for Semiconductor Process Characterization},
author = {Kenneth W. Tobin and Thomas P. Karnowski and Lloyd F. Arrowood and Regina K. Ferrell and James S. Goddard and Fred Lakhani},
year = {2002},
doi = {10.1155/S1110865702203017},
url = {http://dx.doi.org/10.1155/S1110865702203017},
tags = {rule-based},
researchr = {https://researchr.org/publication/TobinKAFGL02},
cites = {0},
citedby = {0},
journal = {EURASIP J. Adv. Sig. Proc.},
volume = {2002},
number = {7},
pages = {704-713},
}