Shun Tobiyama, Yukiko Yamaguchi, Hajime Shimada, Tomonori Ikuse, Takeshi Yagi. Malware Detection with Deep Neural Network Using Process Behavior. In 40th IEEE Annual Computer Software and Applications Conference, COMPSAC Workshops 2016, Atlanta, GA, USA, June 10-14, 2016. pages 577-582, IEEE, 2016. [doi]
@inproceedings{TobiyamaYSIY16,
title = {Malware Detection with Deep Neural Network Using Process Behavior},
author = {Shun Tobiyama and Yukiko Yamaguchi and Hajime Shimada and Tomonori Ikuse and Takeshi Yagi},
year = {2016},
doi = {10.1109/COMPSAC.2016.151},
url = {http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2016.151},
researchr = {https://researchr.org/publication/TobiyamaYSIY16},
cites = {0},
citedby = {0},
pages = {577-582},
booktitle = {40th IEEE Annual Computer Software and Applications Conference, COMPSAC Workshops 2016, Atlanta, GA, USA, June 10-14, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8845-0},
}