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High Performance BIST PLL approach for VCO testing

Intissar Toihria, Rim Ayadi, Mohamed Masmoudi. High Performance BIST PLL approach for VCO testing. In 2014 1st International Conference on Advanced Technologies for Signal and Image Processing (ATSIP), Sousse, Tunisia, March 17-19, 2014. pages 517-522, IEEE, 2014. [doi]

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