Knowledge transfer: Does more experience yield improved design quality? - researchr publication authors

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DeLean Tolbert, Reis Lehman, Guannan Liu, Benjamin Sadler, Monica Cardella. Knowledge transfer: Does more experience yield improved design quality?. In 2016 IEEE Frontiers in Education Conference, FIE 2015, Eire, PA, USA, October 12-15, 2016. pages 1-4, IEEE Computer Society, 2016. [doi]

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