Improved Minimum Distance Classification with Gaussian Outlier Detection for Industrial Inspection - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Daniel Toth, Til Aach. Improved Minimum Distance Classification with Gaussian Outlier Detection for Industrial Inspection. In 11th International Conference on Image Analysis and Processing (ICIAP 2001), 26-28 September 2001, Palermo, Italy. pages 584-588, IEEE Computer Society, 2001. [doi]

This author has not been identified. Look up 'Daniel Toth' in GoogleThis author has not been identified. Look up 'Til Aach' in Google

runs on WebDSL