Mark B. Trakhtenbrot. Mutation Patterns for Temporal Requirements of Reactive Systems. In 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017. pages 116-121, IEEE Computer Society, 2017. [doi]
@inproceedings{Trakhtenbrot17, title = {Mutation Patterns for Temporal Requirements of Reactive Systems}, author = {Mark B. Trakhtenbrot}, year = {2017}, doi = {10.1109/ICSTW.2017.27}, url = {http://dx.doi.org/10.1109/ICSTW.2017.27}, researchr = {https://researchr.org/publication/Trakhtenbrot17}, cites = {0}, citedby = {0}, pages = {116-121}, booktitle = {2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017}, publisher = {IEEE Computer Society}, isbn = {978-1-5090-6676-6}, }