Improving Collaborative Metric Learning with Efficient Negative Sampling

Viet-Anh Tran, Romain Hennequin, Jimena Royo-Letelier, Manuel Moussallam. Improving Collaborative Metric Learning with Efficient Negative Sampling. In Benjamin Piwowarski, Max Chevalier, Éric Gaussier, Yoelle Maarek, Jian-Yun Nie, Falk Scholer, editors, Proceedings of the 42nd International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR 2019, Paris, France, July 21-25, 2019. pages 1201-1204, ACM, 2019. [doi]

@inproceedings{TranHRM19,
  title = {Improving Collaborative Metric Learning with Efficient Negative Sampling},
  author = {Viet-Anh Tran and Romain Hennequin and Jimena Royo-Letelier and Manuel Moussallam},
  year = {2019},
  doi = {10.1145/3331184.3331337},
  url = {https://doi.org/10.1145/3331184.3331337},
  researchr = {https://researchr.org/publication/TranHRM19},
  cites = {0},
  citedby = {0},
  pages = {1201-1204},
  booktitle = {Proceedings of the 42nd International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR 2019, Paris, France, July 21-25, 2019},
  editor = {Benjamin Piwowarski and Max Chevalier and Éric Gaussier and Yoelle Maarek and Jian-Yun Nie and Falk Scholer},
  publisher = {ACM},
  isbn = {978-1-4503-6172-9},
}