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A Sample-Based Algorithm for Visual Assessment of Cluster Tendency (VAT) with Large Datasets

Le Hong Trang, Pham Van Ngoan, Nguyen Van Duc. A Sample-Based Algorithm for Visual Assessment of Cluster Tendency (VAT) with Large Datasets. In Tran Khanh Dang, Josef Küng, Roland R. Wagner, Nam Thoai, Makoto Takizawa 0001, editors, Future Data and Security Engineering - 5th International Conference, FDSE 2018, Ho Chi Minh City, Vietnam, November 28-30, 2018, Proceedings. Volume 11251 of Lecture Notes in Computer Science, pages 145-157, Springer, 2018. [doi]

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Le Hong Trang

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Pham Van Ngoan

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Nguyen Van Duc

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