Patent Value Analysis Using Deep Learning Models - The Case of IoT Technology Mining for the Manufacturing Industry - researchr publication authors

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Amy J. C. Trappey, Charles V. Trappey, Usharani Hareesh Govindarajan, John J. H. Sun. Patent Value Analysis Using Deep Learning Models - The Case of IoT Technology Mining for the Manufacturing Industry. IEEE Trans. Engineering Management, 68(5):1334-1346, 2021. [doi]

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