Static source code metrics and static analysis warnings for fine-grained just-in-time defect prediction

Alexander Trautsch, Steffen Herbold, Jens Grabowski. Static source code metrics and static analysis warnings for fine-grained just-in-time defect prediction. In IEEE International Conference on Software Maintenance and Evolution, ICSME 2020, Adelaide, Australia, September 28 - October 2, 2020. pages 127-138, IEEE, 2020. [doi]

Authors

Alexander Trautsch

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Steffen Herbold

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Jens Grabowski

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