JTAG system test in a MicroTCA world

Bradford G. Van Treuren, Adam W. Ley. JTAG system test in a MicroTCA world. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]

Authors

Bradford G. Van Treuren

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Adam W. Ley

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